Content tagged with: Electrodeposition and Impedance spectroscopy (IS)Found 2 matches.
Refine Search Results [reset]
Filter content on additional tags:Atomic force microscopy (AFM), Co-deposition, Current-voltage (IV), Cyclic voltammetry (CV), Electron-beam lithography, Energy dispersive x-ray spectroscopy (EDS), Focused ion beam, Focused ion beam (FIB), Hall effect, Intercalated materials, LEED, Magnetic, Magnetic force microscopy (MFM), Nanomagnet arrays, Parametric device characterization, Reactive ion etching, Scanning tunneling microscopy (STM), Sputtering, Structural, Thin films, Wet etching
View Directory Map
This project is supported by theNational Science FoundationCMMI-1025020Center for Hierarchical Manufacturing