Content tagged with: Electrodeposition and Magnetic force microscopy (MFM)Found 2 matches.
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Filter content on additional tags:Atomic force microscopy (AFM), Co-deposition, Current-voltage (IV), Cyclic voltammetry (CV), Electron-beam lithography, Energy dispersive x-ray spectroscopy (EDS), Focused ion beam, Focused ion beam (FIB), Hall effect, Impedance spectroscopy (IS), Intercalated materials, LEED, Magnetic, Nanomagnet arrays, Parametric device characterization, Reactive ion etching, Scanning tunneling microscopy (STM), Sputtering, Structural, Thin films, Wet etching
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This project is supported by theNational Science FoundationCMMI-1025020Center for Hierarchical Manufacturing