Oxford Instruments Asylum Research, Inc. and Harvard University’s Center
for Nanoscale Systems (CNS) announce an AFM Workshop and Tutorials Aug.
21-22. The workshop will focus on new techniques and instrumentation
for nanomechanical and nanoelectrical characterization. Leading AFM
scientists in their respective fields of materials and bioscience will
present their latest results on the first day of the meeting. AFM
techniques and scans modes will be demonstrated live on the Asylum
Research Cypher ES™ Environmental AFM.
The second day of the workshop will include tutorial demonstrations on
nanomechanics and electrical characterization techniques, including
scanning microwave impedance microscopy (sMIM). The workshop is ideal
for both novice and experienced AFM users.
Contact:
Nushaw Ghofranian, Asylum Research, 888-472-2795
