Scanning Probe Microscopy (SPM) is a powerful tool for imaging and metrology of non-conducting surfaces and structures down to sub-nanometre level with minimal preparation. Early SPMs could only be used to measure surface topography, but now surface properties as diverse as magnetic, electrical, biological cell and protein structure, electrochemistry and mechanical properties as well can all be studied using this ever-versatile technique that provides a window on the multi-faceted nanoscale world.
The UK SPM conference is an annual event organised by the Royal Microscopial Society. It now attracts participants not only from the UK but also from Europe, North America, Asia and Australasia. In 2009, NPL will lead the scientific organisation for the meeting.
The conference will cover a wide variety of applications from biological molecules, biomaterials, polymers, crystals, metal and catalyst surfaces, nanostructures, nanomanipulation, dimensional metrology, instrument and probe development, and more.
Teddington, Middlesex, UK