Data interpretation has become perhaps the most important barrier limiting the application and impact of modern surface analysis techniques. This workshop will provide a unique forum to bring together the experts in Surface Analysis. Chemometrics and Informatics to address this challenge. The workshop will address analysis of spectra, images and depth profiles and multi-technique analysis and will include a wide range of multivariate and informatics techniques including PCA, MCR, PLS, DFA, MAF, Mutual Information Theory, Neural Networks, G-SIMS, libraries and standards, relevant to SIMS, XPS, Auger and MALDI techniques.
Trinadad and Tobago, West Indies
Contact:
Conference Chairs: Bonnie Tyler, email- Prof.Bonnie@gmail.com; Joanna Lee- email joanna.lee@npl.co.uk
joanna.lee@npl.co.uk
