Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems: Researchers at the University of Illinois Urbana-Champaign have demonstrated a new technique for simultaneous structural and chemical characterization of samples at the femtogram level. Their technique combines atomic force microscopy with Raman or Fourier transform infrared spectroscopy. Their work, funded by the NSF through the Nano-CEMMS, will be published in the journal Analytical Chemistry.

Pictured: William King, professor of mechanical science and engineering, Rohit Bhargava, professor of bioengineering, and Keunhan Park, postdoctoral research associate. 

Read the Press Release from UIUC; Visit Nano-CEMMS.