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SPIE Scanning Microscopies 2015

Conference
Tuesday, September 29, 2015 - 1:00am to Thursday, October 1, 2015 - 1:00am

SPIE Scanning Microscopies, a multidisciplinary
conference for advancing scanning microscopy technologies and
applications. This event brings microscopists from all phase of scanning
microscopies (from scanned optics to scanned particle beams) together
in a single forum to discuss current research and new advancements in
the field.

Contact:
patw@spie.org