Dr. Andrew Pollard

Research Scientist
National Physical Laboratory

Andrew Pollard received his MSci in Physics from the University of Nottingham in 2005 and finished his PhD with Professor Peter Beton from the University of Nottingham's Nanoscience group in 2010. Andrew's previous work includes development of a combined AFM-STM system in UHV, production of graphene monolayers on transition metal surfaces in UHV and subsequent STM surface studies.

After joining NPL in 2009, Andrew is now leading the Surface and Nanoanalysis Group's research into the measurement of graphene, other graphene-like advanced 2-D materials, and associated devices. This metrology research focuses on the actual measurement of the materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS) and ellipsometry. Andrew is also engaged with organisations in the emerging graphene industry, advising on aspects of standards and measurement in this area.