Founded in 2008, Nanotronics Imaging is a high-tech, cutting edge, microscopy and software company delivering rapid testing and analysis solutions to sectors ranging from materials science, and semiconductors to life science and medicine. Nanotronics Imaging nearly quadrupled business in 2012 offering tremendous value and efficiency to inspection systems in the semiconductor sphere. The nSPEC® delivers crisp images, rapid results, accurate quantification and categorization of defect size, characteristic, placement, distribution and others.
If your AFM data is important to you, put your trust in Carbon Design Innovations. We're experts in the production of carbon nanotube AFM probes, sensors and array devices. What sets us apart is our team and the unique technology we employ in our state-of-the-art nanofabrication facility. Our ability to provide the right probe for the task is extremely valuable to customers who are routinely faced with demanding applications. Your goal is to achieve data accuracy - our job is to provide superior and cost-effective carbon nanotube solutions.
CVD Equipment Corporation designs and manufactures a wide variety of process solutions incorporating temperature, pressure, gas delivery and related safety controls. Our custom equipment solutions include Chemical Vapor Deposition systems, gas cabinets, gas panels, scrubbers, surface reflow ovens, and other process equipment support services. Our equipment is used globally for research, quality control and production across many industries including Alternative Energy, Nanotechnology, Graphene, Optoelectronic, Semiconductor and MEMS.
SemiProbe designs and manufactures the most innovative and modular probing, inspection and test solutions available today. Our customers include Universities, Government Research Labs, and a broad range of semiconductor companies developing both existing and innovative, emerging technologies including MEMS, nanotechnology, optoelectronics, photovoltaics and more. With hundreds of installed systems across five continents, we provide cost-effective test systems and accessories to meet a wide variety of applications from R&D through production.
Plasma-Therm is a U.S. based manufacturer of etch and thin film deposition equipment for a number of global compound semiconductor and related specialty markets. For more than 35 years, we have enabled various process technologies by coupling reliable platforms with award-winning service. We hold over 37 patents for innovation in plasma process technologies.
Eulitha is a pioneer and leader in production of high-quality nanostructures using advanced lithography techniques. We offer custom-made and standardized nanostructures with resolution extending down to sub-20 nm region.
Eulitha introduced the revolutionary technology in 2010 for low-cost fabrication of photonic nanostructures over large areas. PHABLE is a proprietary lithography technology that is designed to enable production of energy efficient LEDs, solar cells and LCD displays.
Redex Nano Labs is an independent and indigenous manufacturer of Multiwall Carbon Nano Tube (MWCNT), Graphene Oxide,Reduced Graphene Oxide & Graphene and the variant dispersions of MWCNT and Graphene with different functional groups. We are preparing MWCNT & Graphene through Chemical and CVD route with the purity >95% up to 99% (recommended). We are having our own Patent Pending Method for the production.
We are the only bulk manufacturer in India with the production capacity of 10-15 kg/day.
Malvern Instruments is a leading supplier of analytical solutions for particle characterization and rheology applications. Our products help our customers improve product quality, performance, increase productivity and yield.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties.